The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Nov. 02, 2021
Applicant:

Rosemount Tank Radar Ab, Mölnlycke, SE;

Inventors:

Mikael Eriksson, Västervik, SE;

Johannes Hjorth, Gothenburg, SE;

Jimmie Söderström, Gothenburg, SE;

Assignee:

ROSEMOUNT TANK RADAR AB, Molnlycke, SE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 23/284 (2006.01); G01S 7/292 (2006.01); G01S 13/88 (2006.01);
U.S. Cl.
CPC ...
G01F 23/284 (2013.01); G01S 7/2922 (2013.01); G01S 13/88 (2013.01);
Abstract

In summary, the present invention thus relates to a method of determining a level of a product in a tank, comprising generating and transmitting an electromagnetic transmit signal; guiding the transmit signal towards and into the product; returning an electromagnetic reflection signal resulting from reflection of the transmit signal; receiving, the reflection signal; determining, based on the reflection signal and a timing relation between the reflection signal and the transmit signal, an echo signal exhibiting an echo signal strength as a function of a propagation parameter indicative of position along the probe; and determining the level of the surface of the product based on a propagation parameter value indicative of a first threshold position along the probe for which the echo signal has reached a predetermined threshold signal strength, and an offset indicative of an offset distance along the probe from the first threshold position towards the second probe end.


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