The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Jul. 22, 2020
Applicant:

Fujifilm Business Innovation Corp., Tokyo, JP;

Inventors:

Takashi Hiramatsu, Kanagawa, JP;

Jungo Harigai, Kanagawa, JP;

Yoshitaka Kuwada, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/26 (2006.01); G01N 21/88 (2006.01); G01S 17/06 (2006.01); H04N 1/401 (2006.01);
U.S. Cl.
CPC ...
G01B 11/26 (2013.01); G01N 21/8851 (2013.01); H04N 1/401 (2013.01); G01S 17/06 (2013.01);
Abstract

A measurement apparatus includes a light irradiator, a light receiver, and a processor. The light irradiator is able to apply light from multiple directions to a specific portion of a subject to be measured. The light receiver receives light reflected by the specific portion. The processor is configured to: cause the light irradiator to apply light to the specific portion sequentially from the multiple directions; and acquire information concerning a tilt of a surface of the specific portion, based on information on light received by the light receiver when light is applied to the specific portion from a first direction and information on light received by the light receiver when light is applied to the specific portion from a second direction. The multiple directions include the first and second directions.


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