The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Aug. 18, 2021
Applicant:

Edwards Vacuum Llc, Sanborn, NY (US);

Inventor:

Imad Mahawili, Roseville, CA (US);

Assignee:

Edwards Vacuum LLC, Sandborn, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); B01D 47/02 (2006.01); B01D 47/10 (2006.01); B01D 50/00 (2022.01); B01D 53/00 (2006.01); B01D 53/32 (2006.01); B01D 53/75 (2006.01); B08B 9/032 (2006.01); C23C 16/44 (2006.01); H05H 1/46 (2006.01);
U.S. Cl.
CPC ...
B01D 47/021 (2013.01); B01D 47/10 (2013.01); B01D 50/00 (2013.01); B01D 53/007 (2013.01); B01D 53/32 (2013.01); B08B 9/0321 (2013.01); C23C 16/4412 (2013.01); H01J 37/32844 (2013.01); B01D 53/005 (2013.01); B01D 2259/80 (2013.01); B01D 2259/818 (2013.01); H05H 1/4652 (2021.05); H05H 2245/17 (2021.05); Y10S 55/30 (2013.01);
Abstract

A semiconductor waste abatement system for a semiconductor processing system includes a vacuum pump, an abatement apparatus having an abatement chamber in fluid communication with a source of semiconductor waste gas from the semiconductor processing chamber, and with the abatement chamber configured to ionize the waste gas and to exhaust ionized gas. The abatement system further includes a filter apparatus with a filter chamber, which forms a liquid reservoir. The inlet of the filter apparatus is in fluid communication with the outlet of the abatement chamber and the liquid reservoir, and the outlet of the filter apparatus is in communication with the inlet of the vacuum pump, wherein the filter chamber is under a vacuum, and wherein semiconductor waste gas is ionized in the abatement chamber and then filtered by the filter apparatus prior to input to the vacuum pump.


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