The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Jul. 19, 2021
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Alexandru Patriciu, Belmont, MA (US);

Alyssa Torjesen, Charlstown, MA (US);

Jan Rongen, Best, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2021.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/584 (2013.01); A61B 6/4441 (2013.01); A61B 6/463 (2013.01); A61B 6/5205 (2013.01); A61B 6/54 (2013.01);
Abstract

Various embodiments of an X-ray imaging system employ a C-arm () and an X-ray overlay controller (). In a planning overlay display mode, the controller () processes a planning X-ray image () and a reference planning X-ray image (), both illustrative of the planning X-ray calibration device () and further processes a base X-ray image () () illustrative of a base X-ray calibration device to control a display of a planned tool trajectory overlay () and a tracked tool position overlay () onto the planning X-ray image (). In a guiding overlay display mode, the controller () processes a pair of interventional X-ray images () and a guiding X-ray image (), all illustrative of a guiding X-ray calibration device (), to control a display of a guidance tool trajectory overlay () and a racked tool position overlay () onto the guiding X-ray image ().


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