The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Jul. 01, 2022
Applicant:

Climate Llc, Saint Louis, MO (US);

Inventors:

Erik Andrejko, Oakland, CA (US);

Ying Xu, Boston, MA (US);

Assignee:

CLIMATE LLC, St. Louis, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01G 22/00 (2018.01); A01G 7/00 (2006.01); G06Q 10/04 (2023.01); G06Q 50/02 (2012.01); H04L 43/045 (2022.01); H04L 67/10 (2022.01); H04L 67/12 (2022.01);
U.S. Cl.
CPC ...
A01G 22/00 (2018.02); A01G 7/00 (2013.01); G06Q 10/04 (2013.01); G06Q 50/02 (2013.01); H04L 43/045 (2013.01); H04L 67/10 (2013.01); H04L 67/12 (2013.01);
Abstract

Methods are provided for improving performance of a computing system used to model potential crop yield. In one example embodiment, a computer-implemented method includes generating a model of potential crop yield, as a function of planting date and relative maturity based, at least in part, on one or more relative maturity maps, one or more planting date maps, and one or more actual production history maps, and storing the model in a memory of the server computer system. The method also includes receiving, via an interface at a field manager computing device, a selection of a particular field and computing, from the model of potential crop yield, a potential yield for the particular field based, at least in part, on a planting date for the particular field, a relative maturity value, and values representing actual production history for the particular field.


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