The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2024

Filed:

May. 20, 2020
Applicants:

Fujifilm Corporation, Tokyo, JP;

Fujifilm Medical Systems Usa, Inc., Lexington, MA (US);

Inventors:

Yasuyo Nenoki, Tokyo, JP;

Junichi Ishigaki, Tokyo, JP;

Keiji Sugihara, Tokyo, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 50/20 (2018.01); G16H 30/40 (2018.01); G16H 50/70 (2018.01);
U.S. Cl.
CPC ...
G16H 50/20 (2018.01); G16H 30/40 (2018.01); G16H 50/70 (2018.01);
Abstract

There is provided a medical examination support apparatus in which the history of diagnosis can be easily grasped at a glance, and an operation method and an operation program thereof. A screen output control unit of a medical examination support server generates a log display screen and transmits the log display screen to a client terminal. In a collective display region in the log display screen, an APL block and a MOL block are collectively displayed in a time series in a distinguishable manner. The APL block is a display block of an automatic processing log APL which is a history of automatically performing analysis processing on examination data obtained in a medical examination performed on a patient by a diagnosis support algorithm to output a result of the analysis processing as diagnosis support information for supporting diagnosis of a doctor. The MOL block is a display block of a manual operation log MOL which is a history of a manual operation of the doctor with respect to the examination data.


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