The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2024

Filed:

Mar. 18, 2021
Applicant:

Siemens Industry Software Inc., Plano, FL (US);

Inventors:

Jongsin Yun, Portland, OR (US);

Benoit Nadeau-Dostie, Gatineau, CA;

Harshitha Kodali, Wilsonville, OR (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/54 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G11C 29/54 (2013.01); G11C 29/56004 (2013.01);
Abstract

A memory-testing circuit configured to perform a test of reference bits in a memory. In a read operation, outputs of data bit columns are compared with one or more reference bit columns. The memory-testing circuit comprises: a test controller and association adjustment circuitry configurable by the test controller to associate another one or more reference bit columns or one or more data bit columns with the data bit columns in the read operation. The test controller can determine whether the original one or more reference bit columns have a defect based on results from the two different association.


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