The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2024

Filed:

Sep. 30, 2021
Applicant:

Sony Group Corporation, Tokyo, JP;

Inventors:

Jong Hwa Lee, San Diego, CA (US);

Praggya Garg, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/46 (2022.01); G06F 18/22 (2023.01); G06V 10/74 (2022.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06V 10/462 (2022.01); G06F 18/22 (2023.01); G06V 10/74 (2022.01); G06V 10/758 (2022.01);
Abstract

Implementations generally relate to evaluation of similar content-based images. In some implementations, a method includes receiving a first image, where the first image includes at least one first object. The method further includes receiving a second image, where the second image includes at least one second object. The method further includes computing a structural similarity index measure (SSIM) value based on the at least one first object and the at least one second object. The method further includes computing a scale invariant feature transform (SIFT) value based on the at least one first object and the at least one second object. The method further includes computing a histogram value based on the at least one first object and the at least one second object. The method further includes computing a similarity score based on the SSIM value, the SIFT value, and the histogram value.


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