The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2024
Filed:
Nov. 24, 2021
Canon Kabushiki Kaisha, Tokyo, JP;
Nobuaki Kuwabara, Yokohama, JP;
Satoru Mamiya, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
The present invention is directed to making it possible to reduce a possibility of image stitching failures. An information processing apparatus includes a feature extraction unit configured to extract feature points from each of a plurality of images of an object to be inspected captured from a plurality of viewpoints, an image quality evaluation unit configured to, for each of the plurality of images, evaluate whether an image quality based on a predetermined index satisfies allowable conditions for inspection works of the object, and an image stitching unit configured to stitch at least a part of the images, among the plurality of images, having the image quality that satisfies the allowable conditions according to a positional relation based on the feature points.