The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2024
Filed:
Feb. 25, 2022
Splunk Inc., San Francisco, CA (US);
Mayank Agarwal, Mountain View, CA (US);
Steven Flanders, Nashua, NH (US);
Justin Smith, San Francisco, CA (US);
Gergely Danyi, Redwood City, CA (US);
SPLUNK Inc., San Francisco, CA (US);
Abstract
A method of tracking errors in a system comprising microservices comprises ingesting a plurality of spans generated by the microservices during a given duration of time. The method further comprises consolidating the plurality of spans associated with the given duration of time into a plurality of traces, wherein each trace comprises a subset of the plurality of spans that comprise a common trace identifier. For each trace, the method comprises: a) mapping a respective trace to one or more error stacks computed for the respective trace and to one or more attributes determined for the respective trace; and b) emitting each error stack computed from the respective trace with an associated pair of attributes. The method then comprises reducing duplicate pairs of error stack and associated attributes and maintaining a count for each pair of error stack and associated attributes.