The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2024
Filed:
Nov. 15, 2019
Johnson Controls Tyco Ip Holdings Llp, Milwaukee, WI (US);
Kirk H. Drees, Cedarburg, WI (US);
Donald R. Albinger, New Berlin, WI (US);
Shawn D. Schubert, Oak Creek, WI (US);
Karl F. Reichenberger, Mequon, WI (US);
Daniel M. Curtis, Franklin, WI (US);
Andrew J. Boettcher, Wauwatosa, WI (US);
Jason T. Sawyer, Greendale, WI (US);
Miguel Galvez, Milwaukee, WI (US);
Walter Martin, Ballymena, GB;
Ryan A. Piaskowski, Milwaukee, WI (US);
Vaidhyanathan Venkiteswaran, Brookfield, WI (US);
Clay G. Nesler, Milwaukee, WI (US);
Siddharth Goyal, Milwaukee, WI (US);
Thomas M. Seneczko, Milwaukee, WI (US);
Young M. Lee, Old Westbury, NY (US);
Sudhi R. Sinha, Milwaukee, WI (US);
Johnson Controls Tyco IP Holdings LLP, Milwaukee, WI (US);
Abstract
A building system including one or more memory devices configured to store instructions that, when executed on one or more processors, cause the one or more processors to collect building device data of a building device, the building device data comprising a plurality of data samples of a data point and generate a time correlated data stream for the data point, the time correlated data stream comprising values of the plurality of data samples of the data point. The instructions cause the one or more processors to generate a time correlated reliability data stream for the data point, the time correlated reliability data stream comprising a plurality of reliability values indicating reliability of the values of the plurality of data samples of the data point.