The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2024

Filed:

Dec. 15, 2021
Applicant:

Mirrorcle Technologies, Inc., Richmond, CA (US);

Inventors:

Veljko Milanovic, Richmond, CA (US);

Abhishek Kasturi, Pleasanton, CA (US);

Assignee:

MIRRORCLE TECHNOLOGIES, INC., Richmond, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/10 (2006.01); G02B 26/08 (2006.01); G02B 27/01 (2006.01); G02B 27/14 (2006.01);
U.S. Cl.
CPC ...
G02B 26/101 (2013.01); G02B 26/0833 (2013.01); G02B 27/0101 (2013.01); G02B 27/0172 (2013.01); G02B 27/141 (2013.01); G02B 2027/0114 (2013.01);
Abstract

An apparatus, comprising, a scan module having one or more laser sources that generate one or more initial laser beams and two or more beam deflectors that deflect the one or more initial laser beams. A beam optic is configured to substantially collimate the one or more initial laser beams to produce one or more collimated laser beams. One or more beam deflector controllers are configured to control an angle of beam deflection from each beam deflector. Relay optics between the two or more beam deflectors are configured to image each sequential beam deflector in an optical chain onto the subsequent beam deflector in such a manner that the beam deflecting from a last beam deflector in the optical chain contains a combination or superposition of all the beam deflections of the beam deflectors in the sequence, and maintains a beam divergence of the one or more collimated beams. A first beam deflector of the two or more beam deflectors is configured to scan about a single axis and a second beam deflector of the two or more beam deflectors is configured to scan in a quasi-static mode about two orthogonal axes.


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