The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2024
Filed:
Jun. 18, 2021
Texas Instruments Incorporated, Dallas, TX (US);
Sujaata Ramalingam, Bangalore, IN;
Karthik Subburaj, Bangalore, IN;
Pankaj Gupta, Dausa, IN;
Anil Varghese Mani, Bangalore, IN;
Karthik Ramasubramanian, Bangalore, IN;
Indu Prathapan, Bangalore, IN;
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A system includes a shift register to store data samples, where the shift register includes a cell under test (CUT), a left guard cell, a right guard cell, a left window, and a right window. The system includes two sets of comparators to compare incoming data samples with data samples in the left window and the right window to compute ranks of the incoming data samples. The system includes a sorted index array to store a rank of the data samples in the shift register. The system includes a selector to select a Kth smallest index from the sorted index array and its corresponding data sample from the shift register. The system includes a target comparator, where the first comparator input receives a data sample from the CUT and the second comparator input receives a Kth smallest data sample, and the comparator output indicates a CFAR target detection.