The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2024

Filed:

Apr. 28, 2022
Applicant:

Sandisk Technologies Llc, Addison, TX (US);

Inventors:

Keyur Payak, Santa Clara, CA (US);

Naveen Thomas, Santa Clara, CA (US);

Assignee:

SANDISK TECHNOLOGIES LLC, Addison, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K 17/00 (2006.01); G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 31/319 (2006.01); H03K 17/693 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31905 (2013.01); G01R 31/2879 (2013.01); G01R 31/31727 (2013.01); G01R 31/31924 (2013.01); H03K 17/693 (2013.01);
Abstract

A charge pump test configuration and corresponding method of operation are disclosed for determining charge pump efficiency without needing to obtain direct current measurements. A first number of clock edges (CEs) of a clock signal supplied to a first charge pump is determined over a period of time for a predetermined output current. The first charge pump is then connected with a charge pump under test (PUT) in a cascaded manner such that an output current of the first charge pump is supplied to the PUT as an input current. A second number of CEs of a clock signal supplied to the first charge pump is determined over the same period of time for the same predetermined output current from the PUT. The efficiency of the PUT can then be determined as the ratio of the first number of CEs to the second number of CEs, or vice versa.


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