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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11927631 B1

PDFFull Text
Date of Patent:
Mar. 12, 2024

Filed:

May. 06, 2020

Test method and apparatus of communication chip, device and medium

Applicant:

Morningcore Technology Co., China, Shanghai, CN;

Inventors:

Shanzhi Chen, Shanghai, CN;

Guobin Su, Shanghai, CN;

Yun Yang, Shanghai, CN;

Assignee:

MORNINGCORE TECHNOLOGY CO., CHINA, , CN;

Attorney:

Kim IP Law Group LLC

Primary Examiner:

April Y Blair

Assistant Examiner:

Sazzad undefined Hossain

Int. Cl.
CPC ...
G01R 31/3183 (2006.01); G01R 31/3167 (2006.01); G01R 31/317 (2006.01); G01R 31/3181 (2006.01); G01R 31/319 (2006.01); G06F 11/20 (2006.01); G06F 11/263 (2006.01); G11C 29/10 (2006.01); H04B 17/29 (2015.01); H04L 1/24 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31835 (2013.01); G01R 31/3167 (2013.01); G01R 31/31703 (2013.01); G01R 31/31813 (2013.01); G01R 31/3183 (2013.01); G01R 31/318385 (2013.01); G01R 31/31908 (2013.01); G06F 11/2038 (2013.01); G06F 11/263 (2013.01); G11C 29/10 (2013.01); H04B 17/29 (2015.01); H04L 1/24 (2013.01); H04L 1/242 (2013.01); H04L 1/244 (2013.01);
Abstract

Provided test method and apparatus of communication chip, device and medium. The test method of communication chip includes receiving end test method and transmitting end test method. The receiving end test method of the communication chip includes: an idle time slot of the receiving end of the communication chip is detected in a running process of the communication chip; a test vector is generated, and a standard result corresponding to the test vector is generated; a data frame containing the test vector is constructed, and the data frame is sent to the receiving end of the communication chip in the idle time slot to enable the receiving end of the communication chip to process the data frame; and a chip processing result uploaded by the receiving end of the communication chip is received, and the standard result is compared with the chip processing result.

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