The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2024
Filed:
Feb. 22, 2022
Applicant:
Evident Canada, Inc., Québec, CA;
Inventor:
Nicolas Badeau, Quebec, CA;
Assignee:
Evident Canada, Inc., Québec, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/06 (2006.01); G01B 17/02 (2006.01); G01N 29/07 (2006.01); G01N 29/24 (2006.01); G01N 29/28 (2006.01);
U.S. Cl.
CPC ...
G01N 29/069 (2013.01); G01B 17/02 (2013.01); G01N 29/07 (2013.01); G01N 29/2406 (2013.01); G01N 29/2437 (2013.01); G01N 29/28 (2013.01); G01N 2291/011 (2013.01); G01N 2291/023 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/101 (2013.01);
Abstract
Techniques for compensating a TFM delay computation live (e.g., during acquisition) as a function of the measured thickness along the scan axis of a probe of an acoustic inspection system. At various scan positions, the acoustic inspection system can measure the thickness of the object under test. With the measured thickness, the acoustic inspection system can compute the delays used for the TFM computation to reflect the actual thickness at that particular scan position of the probe.