The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2024

Filed:

Dec. 01, 2020
Applicant:

Jvckenwood Corporation, Yokohama, JP;

Inventors:

Atsushi Saito, Yokohama, JP;

Shigehiko Iwama, Yokohama, JP;

Masahiro Yamamoto, Yokohama, JP;

Assignee:

JVCKENWOOD CORPORATION, Yokohama, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/00 (2006.01); G01N 15/14 (2006.01); G01N 21/41 (2006.01); G01N 33/543 (2006.01); G01R 23/10 (2006.01); G01S 7/48 (2006.01); G01S 7/487 (2006.01);
U.S. Cl.
CPC ...
G01N 15/14 (2013.01); G01N 21/41 (2013.01); G01N 33/543 (2013.01); G01R 23/10 (2013.01); G01S 7/4873 (2013.01);
Abstract

An analysis threshold determination device includes a threshold determination unit for determining a pair of or plural pairs of thresholds used for analysis in accordance with a pair of thresholds generated by a calculation unit and a count value output from a pulse count unit. The calculation unit repeatedly generates a new pair of thresholds in which at least one of the pair of thresholds is changed every time the pulse count unit counts the pulse until reaching a predetermined value. The threshold determination unit chooses a class of a measure of central tendency according to a frequency distribution defining each pair of thresholds generated as a class and the count value output from the pulse count unit as a frequency. The threshold determination unit determines a pair of or plural pairs of thresholds corresponding to a class of a predetermined range from the class of measure of central tendency.


Find Patent Forward Citations

Loading…