The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2024

Filed:

May. 05, 2019
Applicant:

Taiyuan University of Technology, Taiyuan, CN;

Inventors:

Mingjiang Zhang, Taiyuan, CN;

Jian Li, Taiyuan, CN;

Jianzhong Zhang, Taiyuan, CN;

Lijun Qiao, Taiyuan, CN;

Baoqiang Yan, Taiyuan, CN;

Yang Xu, Taiyuan, CN;

Baoquan Jin, Taiyuan, CN;

Dong Wang, Taiyuan, CN;

Yu Wang, Taiyuan, CN;

Yuncai Wang, Taiyuan, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01); G01K 11/324 (2021.01);
U.S. Cl.
CPC ...
G01K 15/005 (2013.01); G01K 11/324 (2021.01); G01K 15/007 (2013.01);
Abstract

A self-calibration detection device and a temperature demodulation method oriented to a fiber Raman temperature sensing system. The self-calibration detection device comprises a fiber Raman thermodetector, thermostatic baths, a multi-mode sensing fiber, and a multi-mode reflector. The fiber Raman thermodetector comprises a pulsed laser whose output end is connected to the input end of a WDM. Two output ends of the WDM are respectively connected to input ends of a first and second APDs. Output ends of the first and second APDs are respectively connected to input ends of a first and second LNAs. Output ends of the first and second LNAs are connected to the input end of a data acquisition card whose output end is connected with the input end of a computer. The temperature demodulation method can solve the problems of low temperature measuring accuracy, lower temperature measurement stability and low temperature measurement efficiency.


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