The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2024

Filed:

Oct. 13, 2022
Applicant:

Paccar Inc, Bellevue, WA (US);

Inventors:

Charles Wayne Reinhardt Swart, Bellingham, WA (US);

Cynthia Chaffin Webb, Sedro-Woolley, WA (US);

Maarten Meijer, Anacortes, WA (US);

Varun Ramesh, Bellingham, WA (US);

Assignee:

PACCAR INC, Bellevue, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F01N 3/20 (2006.01); B01D 53/94 (2006.01); F01N 11/00 (2006.01); F01N 13/00 (2010.01);
U.S. Cl.
CPC ...
F01N 3/208 (2013.01); B01D 53/9418 (2013.01); B01D 53/9495 (2013.01); F01N 11/00 (2013.01); F01N 13/009 (2014.06); F01N 13/0093 (2014.06); F01N 2550/03 (2013.01); F01N 2550/05 (2013.01); F01N 2610/02 (2013.01); F01N 2610/1406 (2013.01); F01N 2900/16 (2013.01); F01N 2900/1621 (2013.01); F01N 2900/1806 (2013.01); F01N 2900/1814 (2013.01); F01N 2900/1818 (2013.01);
Abstract

The present disclosure describes methods for evaluating quality of DEF dosed to an EAS including a close coupled SCR unit a downstream SCR unit. A NOx conversion efficiency of the close coupled SCR unit and a NOx conversion efficiency of the downstream SCR unit are used to evaluate quality of DEF. In some embodiments, the NOx conversion efficiency of close coupled SCR unit is used to evaluate quality of DEF. Operation of an EAS using the results of the evaluation of quality of DEF are described.


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