The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2024
Filed:
Oct. 21, 2019
The Chinese University of Hong Kong, New Territories, HK;
Yuk-Ming Dennis Lo, Hong Kong SAR, CN;
Cheuk Ho Tsang, Hong Kong SAR, CN;
Peiyong Jiang, Hong Kong SAR, CN;
Si Long Vong, Hong Kong SAR, CN;
Rossa Wai Kwun Chiu, Hong Kong SAR, CN;
The Chinese University of Hong Kong, New Territories, HK;
Abstract
The quality of cell-free DNA for analysis is improved by techniques described herein. Cell-free DNA may include DNA with defects that do not allow for analysis of those DNA with techniques such as sequencing and targeted capture enrichment. These defects may be defects within the strands of the DNA and not present at the ends of the DNA. These intrastrand defects in cell-free DNA can be repaired. The repair of the defects in cell-free DNA may then allow for these repaired cell-free DNA to be analyzed by techniques, including sequencing and targeted capture enrichment.