The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2024

Filed:

Apr. 26, 2019
Applicant:

Hewlett-packard Development Company, L.p., Spring, TX (US);

Inventors:

Ana Cristina Garcia Alvarez, Sant Cugat del Valles, ES;

Maurizio Bordone, Sant Cugat del Valles, ES;

Alexander Jose Perez Garcia, Sant Cugat del Valles, ES;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/165 (2006.01); G01N 21/31 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
B41J 2/16535 (2013.01); G01N 21/314 (2013.01); G01N 21/8806 (2013.01); B41J 2002/1655 (2013.01); G01N 2021/3181 (2013.01); G01N 2021/8845 (2013.01);
Abstract

In an example, a surface inspection apparatus includes a light source to illuminate a portion of a surface in a print apparatus, a light detection apparatus and processing circuitry. The light detection apparatus may receive diffusely reflected light and specularly reflected light from the portion of the surface, and may comprise a detection element for detecting the specularly reflected light. The processing circuitry may comprise a comparison module to determine a relationship between an intensity of the detected diffusely reflected light and the detected specularly reflected light and a quality module to evaluate if the surface meets a quality criterion based on the relationship.


Find Patent Forward Citations

Loading…