The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2024

Filed:

Jun. 17, 2021
Applicant:

Arcam Ab, Mölnlycke, SE;

Inventor:

Anders Snis, Uddevalla, SE;

Assignee:

Arcam AB, Mölnlycke, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B22F 10/31 (2021.01); B22F 10/85 (2021.01); B22F 12/33 (2021.01); B22F 12/41 (2021.01); B22F 12/45 (2021.01); B22F 12/52 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); H01J 37/22 (2006.01); H01J 37/304 (2006.01); B22F 10/28 (2021.01);
U.S. Cl.
CPC ...
B22F 10/31 (2021.01); B22F 10/85 (2021.01); B22F 12/33 (2021.01); B22F 12/41 (2021.01); B22F 12/45 (2021.01); B22F 12/52 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); H01J 37/222 (2013.01); H01J 37/304 (2013.01); B22F 10/28 (2021.01); H01J 2237/30433 (2013.01);
Abstract

Calibration systems, additive manufacturing systems employing the same, and methods of calibrating include a plurality of electron beam guns. One calibration system includes an imaging device positioned to capture one or more images of an impingement of electron beams emitted from the plurality of electron beam guns on a surface within a build chamber of the electron beam additive manufacturing system and an analysis component communicatively coupled to the imaging device. The analysis component is programmed to receive image data corresponding to the one or more images, determine one or more calibration parameters from the image data, and transmit one or more instructions to the plurality of electron beam guns in accordance with the one or more calibration parameters.


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