The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2024
Filed:
Sep. 29, 2020
Shenyang Intelligent Neuclear Medical Technology Co., Ltd., Liaoning, CN;
Rumei Zhang, Shanghai, CN;
Long Yang, Shanghai, CN;
Peng Gao, Shanghai, CN;
Guodong Liang, Shanghai, CN;
Jun Zhang, Shanghai, CN;
Shenyang Intelligent Neuclear Medical Technology Co., Ltd., Shenyang, CN;
Abstract
The present disclosure relates to reconstructing an image. According to an embodiment of the present disclosure, identifying a plurality of first scan data sets and a second scan data set from PET scan data, wherein each of the first scan data sets corresponds to an intra-crystal Compton scattering event occurred in a plurality of crystals of a detector and includes two or more first single event data groups, and each of the first single event data groups comprises an energy value less than a preset first energy threshold, the second scan data set comprises one or more second single event data groups and each of the second single event data groups comprises an energy value exceed a preset second energy threshold; for each of the plurality of first scan data sets: searching the second scan data set for a target second single event data group which matches with the first scan data set; obtaining first coincidence event data from each of the first single event data groups in the first scan data set and the target second single event data group as coincidence event data recovered from an intra-crystal Compton scattering event corresponding to the first scan data set; reconstructing an image with the first coincidence event data and second coincidence event data which involves coincidence events corresponding to the second scan data set.