The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Mar. 15, 2022
Applicant:

Kioxia Corporation, Tokyo, JP;

Inventors:

Yasuhito Yoshimizu, Yokkaichi Mie, JP;

Takashi Fukushima, Yokkaichi Mie, JP;

Tatsuro Hitomi, Yokohama Kanagawa, JP;

Arata Inoue, Chigasaki Kanagawa, JP;

Masayuki Miura, Yokkaichi Mie, JP;

Shinichi Kanno, Tokyo, JP;

Toshio Fujisawa, Yokohama Kanagawa, JP;

Keisuke Nakatsuka, Kobe Hyogo, JP;

Tomoya Sanuki, Yokkaichi Mie, JP;

Assignee:

Kioxia Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); G06F 11/07 (2006.01); H01L 23/544 (2006.01);
U.S. Cl.
CPC ...
H01L 24/05 (2013.01); G06F 11/073 (2013.01); G06F 11/0751 (2013.01); H01L 23/544 (2013.01); H01L 2223/5446 (2013.01); H01L 2224/05139 (2013.01); H01L 2224/05144 (2013.01); H01L 2224/05147 (2013.01); H01L 2224/05155 (2013.01); H01L 2224/05157 (2013.01); H01L 2224/05164 (2013.01); H01L 2924/14511 (2013.01);
Abstract

A memory chip unit includes a pad electrode including first and second portions, and a memory cell array. A prober includes a probe card and a movement mechanism. The probe card includes a probe electrode to be in contact with the pad electrode, and a memory controller electrically coupled to the probe electrode and executes reading and writing on the memory cell array. The movement mechanism executes a first operation that brings the probe electrode into contact with the first portion and does not bring the probe electrode into contact with the second portion, and a second operation that does not bring the probe electrode into contact with the first portion and brings the probe electrode into contact with the second portion.


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