The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Jun. 03, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Junghyun Cho, Hwaseong-si, KR;

Sang-Geun Park, Hwaseong-si, KR;

Dongseok Baek, Hwaseong-si, KR;

Jaehyuk Choi, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); H01L 21/66 (2006.01); H01L 21/683 (2006.01); H01L 23/31 (2006.01); H01L 23/48 (2006.01); H01L 21/56 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67132 (2013.01); H01L 21/67092 (2013.01); H01L 21/67103 (2013.01); H01L 21/67109 (2013.01); H01L 21/67259 (2013.01); H01L 21/67288 (2013.01); H01L 21/6835 (2013.01); H01L 22/12 (2013.01); H01L 23/3121 (2013.01); H01L 23/481 (2013.01); H01L 21/56 (2013.01); H01L 24/13 (2013.01); H01L 24/94 (2013.01); H01L 2221/68327 (2013.01); H01L 2221/6834 (2013.01); H01L 2221/68395 (2013.01); H01L 2224/13023 (2013.01); H01L 2224/13025 (2013.01);
Abstract

A semiconductor packaging apparatus and methods of manufacturing semiconductor devices using the same. The semiconductor packaging apparatus includes a process unit, and a controller associated with the process unit. The process unit includes a bonding part that bonds a semiconductor substrate and a carrier substrate to each other to form a bonded substrate, a cooling part that cools the bonded substrate, and a detection part in the cooling part and configured to detect a defect of the bonded substrate. The controller is configured to control the process unit using data obtained from the detection part.


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