The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Apr. 08, 2019
Applicants:

Helmholtz Zentrum München Deutsches Forschungszentrum Für Gesundheit Und Umwelt (Gmbh), Neuherberg, DE;

Photonion Gmbh, Schwerin, DE;

Inventors:

Ralf Zimmermann, Bergisch Gladbach, DE;

Johannes Passig, Rostock, DE;

Sven Ehlert, Gelbensande, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/02 (2006.01); H01J 49/04 (2006.01); H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0463 (2013.01); H01J 49/0031 (2013.01); H01J 49/0095 (2013.01); H01J 49/025 (2013.01); H01J 49/162 (2013.01); H01J 49/164 (2013.01);
Abstract

Devices and methods for mass spectroscopic analysis of particles are disclosed herein. An example device includes: a first irradiation unit configured to irradiate a particle with electromagnetic radiation to cause components of the particle to detach from the particle. The example device further includes a second irradiation unit configured to irradiate substantially simultaneously i) at least a part of the detached components, and optionally a residual core of the particle, with a first beam of electromagnetic radiation the first beam of electromagnetic radiation exhibiting a first intensity, and ii) at least a part of the residual core, of the particle with a second beam of electromagnetic radiation. The second beam of electromagnetic radiation exhibiting a second intensity, which is preferably larger than the first intensity. The example device further includes a mass spectrometer comprising an ion source region, a first detection channel, and optionally a second detection channel.


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