The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Jun. 22, 2021
Applicant:

Boe Technology Group Co., Ltd., Beijing, CN;

Inventor:

Tong Liu, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/75 (2022.01); G05B 19/418 (2006.01); G06F 18/22 (2023.01); G06F 18/24 (2023.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06T 7/12 (2017.01); G06T 7/136 (2017.01); G06T 7/33 (2017.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
G06V 10/757 (2022.01); G05B 19/41875 (2013.01); G06F 18/22 (2023.01); G06F 18/24 (2023.01); G06T 7/001 (2013.01); G06T 7/11 (2017.01); G06T 7/12 (2017.01); G06T 7/136 (2017.01); G06T 7/337 (2017.01); G06T 7/90 (2017.01); G05B 2219/32368 (2013.01); G06V 2201/06 (2022.01);
Abstract

Disclosed are a product inspection method and device, producing system and a computer storage medium. The method comprises: conducting image acquisition on a product assembly line to obtain a production line image; extracting a product image including a product to be inspected from the production line image; extracting an inspection point image in a part inspection area in the product image; inputting the inspection point image into an inspection model to obtain an inspection result; and determining that the product to be inspected in the product image has defects under the condition that the inspection result meets any of the following conditions.


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