The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Dec. 06, 2019
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Katsuyuki Kawamata, Kyoto, JP;

Kensuke Tarumi, Osaka, JP;

Assignee:

OMRON CORPORATION, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); B25J 19/02 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0006 (2013.01); B25J 19/023 (2013.01); G06T 2207/30164 (2013.01);
Abstract

An alignment device includes a holding device capable of holding the second workpiece, a moving device that moves the holding device toward the first workpiece, a mirror member capable of reflecting the second workpiece, the mirror member being arranged adjacent to the first workpiece, an image sensor arranged to be able to simultaneously and continuously capture the first workpiece and a mirror image of the second workpiece reflected on the mirror member, and a control device that performs feedback control of the moving device based on the calculated position of the second workpiece with respect to the first workpiece based on the first workpiece and the mirror image of the second workpiece, which are captured by the image sensor, to align the second workpiece with the first workpiece.


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