The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Jun. 22, 2022
Applicant:

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Jung-Yi Lin, New Taipei, TW;

Chieh Lee, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/20 (2006.01); G06T 19/20 (2011.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 17/205 (2013.01); G06T 7/75 (2017.01); G06T 19/20 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20076 (2013.01); G06T 2219/2024 (2013.01);
Abstract

A method for adjusting point cloud density, an electronic device, and a storage medium are provided. In the method an initial point cloud map and a distance determination threshold of a robot are obtained. A plurality of target regions in the initial point cloud map are determined, and an environmental complexity value of each target region is calculated. The initial point cloud map is divided into submaps, and a point cloud density coefficient of each submap is determined. The initial point cloud map is adjusted according to the point cloud density coefficient and the target point cloud map is obtained. By utilizing such method, adjustment efficiency and an accuracy of point cloud density can be improved.


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