The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Dec. 20, 2021
Applicant:

Tactical Computing Laboratories, Llc, Muenster, TX (US);

Inventors:

John D. Leidel, Muenster, TX (US);

David Donofrio, San Francisco, CA (US);

Ryan Kabrick, New Castle, DE (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/41 (2018.01);
U.S. Cl.
CPC ...
G06F 8/433 (2013.01); G06F 8/443 (2013.01); G06F 8/456 (2013.01);
Abstract

Methods for analyzing and improving a target computer application and corresponding systems and computer-readable mediums. A method includes receiving the target application. The method includes generating a parallel control flow graph (ParCFG) corresponding to the target application. The method includes analyzing the ParCFG by the computer system. The method includes generating and storing the modified ParCFG for the target application.


Find Patent Forward Citations

Leidel, John. (2024). Systems and methods for application performance profiling and improvement (U.S. Patent No. 11922148). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11922148

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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