The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Jun. 01, 2023
Applicant:

Hiddenlayer, Inc., Austin, TX (US);

Inventors:

David Beveridge, Tillamook, OR (US);

Andrew Davis, Portland, OR (US);

Assignee:

HiddenLayer, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/64 (2013.01); G06F 21/00 (2013.01); G06F 21/57 (2013.01); G06F 21/62 (2013.01);
U.S. Cl.
CPC ...
G06F 21/64 (2013.01); G06F 21/577 (2013.01); G06F 21/629 (2013.01);
Abstract

Data is received that characterizes artefacts associated with each of a plurality of layers of a first machine learning model. Fingerprints are then generated for each of the artefacts in the layers of the first machine learning model. These generated fingerprints collectively form a model indicator for the first machine learning model. It is then determined whether the first machine learning model is derived from another machine learning model by performing a similarity analysis between the model indicator for the first machine learning model and model indicators generated for each of a plurality of reference machine learning models each comprising a respective set of fingerprints. Data characterizing the determination can be provided to a consuming application or process. Related apparatus, systems, techniques and articles are also described.


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