The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2024
Filed:
Nov. 02, 2020
Oracle International Corporation, Redwood Shores, CA (US);
Zexi Chen, Mountain View, CA (US);
Kenny C. Gross, Escondido, CA (US);
Ashin George, Sunnyvale, CA (US);
Guang C. Wang, San Diego, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
The disclosed embodiments relate to a system that characterizes susceptibility of an inferential model to follow signal degradation. During operation, the system receives a set of time-series signals associated with sensors in a monitored system during normal fault-free operation. Next, the system trains the inferential model using the set of time-series signals. The system then characterizes susceptibility of the inferential model to follow signal degradation. During this process, the system adds degradation to a signal in the set of time-series signals to produce a degraded signal. Next, the system uses the inferential model to perform prognostic-surveillance operations on the set of time-series signals with the degraded signal. Finally, the system characterizes susceptibility of the inferential model to follow degradation in the signal based on results of the prognostic-surveillance operations.