The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Jun. 08, 2021
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Suman K. Nath, Redmond, WA (US);

Peter C. Shrosbree, Redmond, WA (US);

Fazle Elahi Faisal, Bothell, WA (US);

Tanakorn Leesatapornwongsa, Redmond, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/30 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3075 (2013.01); G06F 11/3692 (2013.01); G06F 11/3696 (2013.01);
Abstract

Systems and methods are provided for automatically generating a fault-enabled software development kit (SDK) to test an application. The generating includes determining one or more faults based on codes associated with the SDK and a frequency of occurrences of faults while executing the SDK. A fault injector automatically injects the determined faults in select layers of code in the SDK and generates fault configuration data associated with the automatically injected faults in the SDK. The fault configuration data describes faults that have been injected in the fault-enabled SDK to test an application. The fault-enabled SDK tests the application without needs for modifying the application code for testing purposes. The fault-enabled SDK further provides types of faults that may be common in using the SDK without requiring application developers to have detailed understanding of internals of the SDK to test the application with simulated faults.


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