The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Jul. 19, 2021
Applicant:

Beijing Baidu Netcom Science and Technology Co., Ltd., Beijing, CN;

Inventors:

Xiang Long, Beijing, CN;

Yan Peng, Beijing, CN;

Shufei Lin, Beijing, CN;

Ying Xin, Beijing, CN;

Bin Zhang, Beijing, CN;

Pengcheng Yuan, Beijing, CN;

Xiaodi Wang, Beijing, CN;

Yuan Feng, Beijing, CN;

Shumin Han, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/24 (2006.01); G02B 21/36 (2006.01); G06F 18/213 (2023.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G02B 21/244 (2013.01); G02B 21/367 (2013.01); G06F 18/213 (2023.01); G06F 18/214 (2023.01);
Abstract

Provided are a method and apparatus for evaluating image relative definition, a device and a medium, relating to technologies such as computer vision, deep learning and intelligent medical. A specific implementation solution is: extracting a multi-scale feature of each image in an image set, where the multi-scale feature is used for representing definition features of objects having different sizes in an image; and scoring relative definition of each image in the image set according to the multi-scale feature by using a relative definition scoring model pre-trained, where the purpose for training the relative definition scoring model is to learn a feature related to image definition in the multi-scale feature.


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