The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Nov. 12, 2018
Applicant:

S.d. Sight Diagnostics Ltd., Tel Aviv, IL;

Inventors:

Noam Yorav-Raphael, Tekoa, IL;

Joseph Joel Pollak, Neve Daniel, IL;

Sarah Levy Schreier, Tel Aviv, IL;

Yochay Shlomo Eshel, Sde Warburg, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01N 21/64 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0076 (2013.01); G01N 21/6456 (2013.01); G02B 21/36 (2013.01);
Abstract

Apparatus and methods are described including a sample carrier () configured to carry a portion of a bodily sample, at least a portion of the sample carrier being configured to fluoresce, at least under certain conditions. An optical measurement device () performs optical measurements upon the portion of the bodily sample that is housed within the sample carrier (), and at least partially photobleaches an area within the portion of the sample carrier () by causing the area to fluoresce. By detecting that the area within the portion of the sample carrier () has been photobleached, an output is generated indicating that at least a portion of the sample carrier () is contaminated or that optical measurements cannot be performed on the portion of the sample carrier (), or the optical measurement device () is prevented from performing optical measurements upon a sample portion housed within the given portion of the sample carrier ().


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