The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2024
Filed:
Jan. 31, 2023
Aeva, Inc., Mountain View, CA (US);
Kumar Bhargav Viswanatha, Santa Clara, CA (US);
Jose Krause Perin, Mountain View, CA (US);
Mina Rezk, Haymarket, VA (US);
James Reuther, San Francisco, CA (US);
James Nakamura, Chicago, IL (US);
Kshitij Jain, Fremont, CA (US);
Aeva, Inc., Mountain View, CA (US);
Abstract
A method transmits a first optical beam towards targets within a field of view (FOV). The first optical beam is modulated at a first chirp rate for a first set of scan lines that correspond to a first distance of the targets. The method identifies conditions based on the FOV to calculate a second chirp rate, and generates a scan pattern by transmitting a second optical beam towards the targets within the FOV. The second optical beam is modulated at the second chirp rate for a second set of scan lines that corresponds to a second distance of the one or more targets. The method generates, based on the first and second optical beams, the point cloud that includes multiple data points related to the target in which some of the data points are related to a first target and other data points are related to a second target.