The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2024
Filed:
Jan. 11, 2021
Applicant:
University of Warwick, Coventry, GB;
Inventors:
Patrick Unwin, Birdingbury, GB;
Kim Martin McKelvey, Coventry, GB;
Assignee:
The University of Warwick, Coventry, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/60 (2010.01); B22D 19/14 (2006.01); C23C 26/02 (2006.01); E21C 35/183 (2006.01);
U.S. Cl.
CPC ...
G01Q 60/60 (2013.01); B22D 19/14 (2013.01); C23C 26/02 (2013.01); E21C 35/183 (2013.01); E21C 35/1831 (2020.05); E21C 35/1833 (2020.05); E21C 35/1835 (2020.05); Y10T 428/12937 (2015.01); Y10T 428/12965 (2015.01);
Abstract
A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging.