The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2024
Filed:
May. 10, 2019
Applicant:
Universite DE Rouen-normandie, Mont-Saint-Aignan, FR;
Inventors:
Gérard Coquerel, Mont-Saint-Aignan, FR;
Simon Clevers, Rouen, FR;
Assignee:
Universite de Rouen-Normandie, Mont-Saint-Aignan, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 23/20016 (2018.01); G01N 23/20033 (2018.01); G01N 23/207 (2018.01);
U.S. Cl.
CPC ...
G01N 23/207 (2013.01); G01N 21/35 (2013.01); G01N 23/20016 (2013.01); G01N 23/20033 (2013.01); G01N 2201/0231 (2013.01); G01N 2201/06113 (2013.01); G01N 2223/056 (2013.01); G01N 2223/31 (2013.01);
Abstract
The present invention relates to a device for spectroscopic measurements, in particular X-ray diffraction (XRD), temperature-resolved second harmonic generation (TR-SHG) or infrared (IR) measurements, which prevents the formation of condensation (dew) or ice (frost) when carrying out spectroscopic measurements in sub-ambient temperature conditions and to a method of spectroscopic measurements with said device.