The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2024
Filed:
Apr. 14, 2022
Baumer Inspection Gmbh, Constance, DE;
Hans-Peter Diehl, Constance, DE;
BAUMER INSPECTION GMBH, Constance, DE;
Abstract
An inspection arrangement for fluorescence-based inspection of a product containing at least one fluorophore having an excitation spectrum and an emission spectrum, the inspection arrangement including a radiation source for generating a first electromagnetic radiation in a first wavelength range containing an excitation spectrum and a second electromagnetic radiation in a second wavelength range containing the emission spectrum, an imaging device for generating images of an inspection area in which the product can be arranged, and an image data processing device for image processing of the images. The inspection arrangement captures with the imaging device at least one fluorescence image of the inspection area irradiated with the first electromagnetic radiation and at least one reference image of the inspection area irradiated with the second electromagnetic radiation. The image data processing device generates a correction image based on the at least one fluorescence image and the at least one reference image.