The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Dec. 02, 2019
Applicant:

Hamamatsu Photonics K.k., Hamamatsu, JP;

Inventors:

Kazumasa Hirawake, Hamamatsu, JP;

Takahiro Murakoshi, Hamamatsu, JP;

Takahiro Shikayama, Hamamatsu, JP;

Takayuki Sato, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6456 (2013.01);
Abstract

A fluorescence observation device is a device for performing fluorescence observation of a sample piece cut out from a sample including: a tray on which the sample piece is placed; a light source unit which generates excitation light to irradiate the sample piece; a detection unit which detects fluorescence from the sample piece; and an image generation unit which generates a fluorescence image of the sample piece based on a detection signal from the detection unit and the tray includes a plurality of placement regions provided around a center region of the tray and also includes a marker portion indicating a cutting orientation of the sample piece with respect to the sample.


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