The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2024
Filed:
Mar. 08, 2022
Tyco Electronics (Shanghai) Co., Ltd., Shanghai, CN;
Te Connectivity Services Gmbh, Schaffhausen, CH;
Lei (Alex) Zhou, Shanghai, CN;
Dandan (Emily) Zhang, Shanghai, CN;
Roberto Francisco-Yi Lu, Bellevue, WA (US);
Lvhai (Samuel) Hu, Shanghai, CN;
Qing (Carrie) Zhou, Shanghai, CN;
Rong Zhang, Shanghai, CN;
Tyco Electronics (Shanghai) Co., Ltd., Shanghai, CN;
TE Connectivity Solutions GmbH, Schaffhausen, CH;
Abstract
A product index mechanism for a product inspection system includes a material strip driving wheel and an index structure driving wheel. The material strip driving wheel engages with a material strip carrying a plurality of products to be inspected by an inspection device of the product inspection system. The driving wheel drives the material strip to move. The index structure driving wheel rotates synchronously with the material strip driving wheel and includes a plurality of product index structures thereon. As a product on the material strip is moved by the material strip driving wheel to an inspection position of the inspection device, one product index structure on the index structure driving wheel is rotated to a trigger position corresponding to a trigger of the inspection system. Activation of the trigger transmits a trigger signal to the inspection device to inspect the product.