The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Oct. 21, 2022
Applicant:

University of Maryland, Baltimore County, Baltimore, MD (US);

Inventors:

Weidong Zhu, Ellicott City, MD (US);

Linfeng Lyu, Halethorpe, MD (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01M 7/02 (2006.01); F03D 17/00 (2016.01); G01H 9/00 (2006.01);
U.S. Cl.
CPC ...
G01M 7/025 (2013.01); F03D 17/00 (2016.05); G01H 9/00 (2013.01);
Abstract

A one-dimensional (1D) and two-dimensional (2D) scan scheme for a tracking continuously scanning laser Doppler vibrometer (CSLDV) system to scan the whole surface of a rotating structure excited by a random force. A tracking CSLDV system tracks a rotating structure and sweep its laser spot on its surface. The measured response of the structure using the scan scheme of the tracking CSLDV system is considered as the response of the whole surface of the structure subject to random excitation. The measured response can be processed by operational modal analysis (OMA) methods (e.g., an improved lifting method, an improved demodulation method, an improved 2D demodulation method). Damped natural frequencies of the rotating structure are estimated from the fast Fourier transform of the measured response. Undamped full-field mode shapes are estimated by multiplying the measured response using sinusoids whose frequencies are estimated damped natural frequencies.


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