The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Feb. 25, 2022
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Yoshihiro Kobayashi, Komagane, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 5/00 (2006.01);
U.S. Cl.
CPC ...
G01M 5/0008 (2013.01); G01M 5/0066 (2013.01);
Abstract

A measurement method includes: a high-pass filter processing step of performing high-pass filter processing on target data including a drift noise to generate drift noise reduction data in which the drift noise is reduced, a correction data estimation step of estimating, based on the drift noise reduction data, correction data corresponding to a difference between the drift noise reduction data and data obtained by removing the drift noise from the target data, and a measurement data generation step of generating measurement data by adding the drift noise reduction data and the correction data.


Find Patent Forward Citations

Kobayashi, Yoshihiro. (2024). Abnormality determination for bridge superstructure based on acceleration data (U.S. Patent No. 11921012). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11921012

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