The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2024
Filed:
Jun. 28, 2021
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/205 (2006.01); B41J 2/01 (2006.01); B41J 2/07 (2006.01); B41J 2/155 (2006.01); B41J 2/21 (2006.01); B41J 3/407 (2006.01); B41J 19/14 (2006.01); H04N 1/405 (2006.01); B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
B41J 2/2054 (2013.01); B41J 2/01 (2013.01); B41J 2/07 (2013.01); B41J 2/155 (2013.01); B41J 2/2132 (2013.01); B41J 3/4073 (2013.01); B41J 19/145 (2013.01); H04N 1/4051 (2013.01); B41J 29/393 (2013.01);
Abstract
Wherein, in the first dither mask, when the first space is cut by the first plane, a plurality of threshold values in the first plane has a blue noise characteristic in the spatial frequency domain, and when the first space is cut by a second plane extending in a direction different from that of the first plane, a plurality of threshold values in the second plane has a blue noise characteristic in the spatial frequency domain.