The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2024
Filed:
Nov. 15, 2019
Lawrence Livermore National Security, Llc, Livermore, CA (US);
Robert Matthew Panas, Dublin, CA (US);
Lawrence Livermore National Security, LLC, Livermore, CA (US);
Abstract
An in situ cure monitoring control system for use with a volumetric three dimensional (3D) printing system, wherein the volumetric 3D system includes a container defining a build volume, the container includes a photocurable resist used for making a 3D part, and the resist is responsive to an optical curing beam from a light source, which is controlled by a controller, and which is passed through the resist. The cure monitoring control system includes an optical signal source which generates optical signals having a wavelength selected in relation to a characteristic of the resist, and directed to pass through the build volume. A detector detects the optical signals and generates output signals in accordance therewith. Software monitors the output signals and uses the output signals to modify the curing beam to help optimize curing of the resist.