The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2024
Filed:
Apr. 28, 2022
Fujifilm Corporation, Tokyo, JP;
Takahiro Kawamura, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An imaging condition acquisition unit acquires an imaging condition in a case in which a subject is imaged in a state in which an object is interposed between the subject and a radiation detector. A body thickness derivation unit derives a body thickness distribution of the subject based on the radiation image and the imaging condition. A characteristic acquisition unit acquires a radiation characteristic of the object in accordance with the body thickness distribution. A ray distribution unit derives a primary ray distribution and a scattered ray distribution of the radiation detected by the radiation detector by using the imaging condition, the body thickness distribution, and the radiation characteristic. A calculation unit updates the body thickness distribution such that an error between a sum of the primary ray distribution and the scattered ray distribution and a pixel value at each position of the radiation image is smaller than a predetermined threshold value, and repeats the derivation of the radiation characteristic based on the updated body thickness distribution and the derivation of the primary ray distribution and the scattered ray distribution.