The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2024
Filed:
Sep. 03, 2020
Shenzhen Institutes of Advanced Technology, Shenzhen, CN;
Haifeng Wang, Shenzhen, CN;
Dong Liang, Shenzhen, CN;
Hairong Zheng, Shenzhen, CN;
Xin Liu, Shenzhen, CN;
Shi Su, Shenzhen, CN;
Zhilang Qiu, Shenzhen, CN;
SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY, Shenzhen, CN;
Abstract
A magnetic resonance imaging method includes: obtaining three-dimensional under-sampling data of a target object based on a first three-dimensional magnetic resonance imaging sequence; obtaining a three-dimensional point spread function based on the three-dimensional under-sampling data or a two-dimensional mapping data of the target object; obtaining a sensitivity map of the target object based on the data collected by three-dimensional low-resolution complete sampling; performing imaging reconstruction to the three-dimensional under-sampling data based on the three-dimensional point spread function and the sensitivity map to obtain a reconstructed magnetic resonance image. The first three-dimensional magnetic resonance imaging sequence has a first sinusoidal gradient field on a phase direction and a second sinusoidal gradient field on a layer selection direction. 0-order moments of the first and the second three-dimensional magnetic resonance imaging sequences are 0. A phase difference between the first and the second three-dimensional magnetic resonance imaging sequence is π/2.