The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Aug. 20, 2020
Applicant:

Topcon Positioning Systems, Inc., Livermore, CA (US);

Inventors:

Antonio R. Asebedo, Manhattan, KS (US);

Jared Ochs, Kansas City, KS (US);

Brian Sorbe, Edgerton, WI (US);

Assignee:

Topcon Positioning Systems, Inc., Livermore, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01D 41/127 (2006.01); A01D 41/12 (2006.01);
U.S. Cl.
CPC ...
A01D 41/1272 (2013.01); A01D 41/1217 (2013.01); A01D 41/1275 (2013.01);
Abstract

A method for processing harvest yield data includes the steps of receiving load data from a grain cart and receiving harvest yield data from a combine harvester. The load data and harvest yield data are post-processed to generate enhanced harvest yield data. The combine harvester and the grain cart can operate in an on-the-go unloading harvest operation or a stationary unloading harvest operation. Post-processing can include creating a field boundary for a harvest area, determining a start time and start position for the combine harvester within the field boundary, and determining an end time and end position for the combine harvester within the field boundary. The total grain yield weight estimated by a yield monitor can be calibrated to match the grain cart total scale weight.


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