The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Nov. 29, 2021
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Sushant Vikram, San Diego, CA (US);

Arvind Vardarajan Santhanam, San Diego, CA (US);

Jyotica Yadav, San Diego, CA (US);

Xiaoning Lu, San Diego, CA (US);

Kushang Desai, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 56/00 (2009.01); H04W 24/02 (2009.01);
U.S. Cl.
CPC ...
H04W 56/001 (2013.01); H04W 24/02 (2013.01); H04W 24/10 (2013.01);
Abstract

Apparatus, methods, and computer-readable media for enhanced inter-frequency detection between misaligned base stations are disclosed herein. A user equipment (UE) may determine that a neighbor cell associated with a first frequency is misaligned with a serving cell associated with a second frequency different than the first frequency based on first measurements of the neighbor cell within a first measurement gap window having a first length. The UE may detect a location of a synchronization signal block (SSB) associated with the neighbor cell within a second measurement gap window having a second length greater than the first length. The UE may determine an alignment offset between the location of the SSB and the first measurement gap window. The UE may obtain second measurements of the neighbor cell within a third measurement gap window that includes the location of the SSB based on the alignment offset and parameters of the SSB.


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