The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
Mar. 15, 2023
Applicant:
Ignis Innovation Inc., Waterloo, CA;
Inventor:
Vyacheslav Shyshkin, Kitchener, CA;
Assignee:
Ignis Innovation Inc., Road Town, VG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 25/40 (2023.01); G06T 7/33 (2017.01); G06T 7/73 (2017.01); G06T 7/80 (2017.01); G09G 3/3233 (2016.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
H04N 25/40 (2023.01); G06T 7/33 (2017.01); G06T 7/73 (2017.01); G06T 7/80 (2017.01); G09G 3/3233 (2013.01); H01L 27/14609 (2013.01); G06T 2207/10024 (2013.01); G09G 2300/0842 (2013.01); G09G 2320/0233 (2013.01); G09G 2320/029 (2013.01); G09G 2320/041 (2013.01); G09G 2320/045 (2013.01); G09G 2320/0693 (2013.01); G09G 2330/10 (2013.01);
Abstract
What is disclosed are systems and methods for optical correction for correcting for non-uniformity in active matrix light emitting diode device (AMOLED) and other emissive displays, using iterative processing of images of calibration patterns including features of coarse and fine granularity to successively generate a high-resolution estimate of the panel pixel locations.